Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Software-based self-test generation for microprocessors with high-level decision diagrams (title)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2
Look more..
(1/20)
Export
export all inquiry results
(2)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
journal article EST
/
journal article ENG
Software-based self-test generation for microprocessors with high-level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Brik, Marina
Proceedings of the Estonian Academy of Sciences
2014
/
p. 48-61 : ill
https://artiklid.elnet.ee/record=b2665215*est
https://doi.org/10.3176/proc.2014.1.08
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
2
book article
Software-based self-test generation for microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Jasnetski, Artjom
;
Brik, Marina
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
Number of records 2, displaying
1 - 2
keyword
20
1.
high-level decision diagrams
2.
high-level decision diagrams (HLDD) synthesis
3.
High-level Decision Diagrams for Modeling Digital Systems
4.
high-level test data generation
5.
Automated Synthesis of Software-based Self-test
6.
software based self-test
7.
software-based self-test
8.
software-based self-test (SBST)
9.
behaviour level test generation
10.
Hierarchical Multi-level Test Generation
11.
high-level decision diagram
12.
high-level synthesis for test
13.
logic level and high level BDDs
14.
Binary Decision Diagrams
15.
binary decision diagrams (BDD)
16.
decision diagrams
17.
highlevel decision diagrams
18.
shared structurally synthesized Binary Decision Diagrams
19.
Structural Decision Diagrams for Modeling Digital Circuits
20.
self learning software
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT