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high-level test data generation (keyword)
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book article
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
book article
2
book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
Number of records 2, displaying
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keyword
36
1.
high-level test data generation
2.
behaviour level test generation
3.
high-level synthesis for test
4.
logic level and high level BDDs
5.
extreme penetration level of non synchronous generation
6.
adaptive test strategy generation
7.
automated test pattern generation
8.
automatic test case generation
9.
automatic test pattern generation
10.
automatic test program generation
11.
functional test generation
12.
highlevel test generation
13.
implementation-independent test generation
14.
offline test generation
15.
provably correct test generation
16.
test generation
17.
test generation and fault diagnosis
18.
test program generation
19.
system level test
20.
high level DD (HLDD)
21.
high level synthesis
22.
high-level control fault model
23.
high-level control faults
24.
high-level decision diagram
25.
high-level decision diagrams
26.
high-level decision diagrams (HLDD) synthesis
27.
high-level expert group on AI
28.
high-level fault coverage
29.
high-level fault model
30.
high-level fault simulation
31.
high-level functional fault model
32.
High-Level Synthesis (HLS)
33.
high-speed serial link test
34.
high-dimensional data
35.
high-frequency data
36.
High-Pressure High-Temperature Spark Plasma Sintering
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