Software-based self-test generation for microprocessors with high-level decision diagrams
statement of authorship
Raimund Ubar, Anton Tsertov, Artjom Jasnetski, Marina Brik
location of publication
[S.l.]
publisher
year of publication
pages
[6] p. : ill
conference name, date
15th IEEE Latin-American Test Workshop, March 12-15, 2014
conference location
Fortaleza, Brazil
keyword
ISBN
978-1-4799-4711-9
notes
Bibliogr.: 22 ref
TTÜ department
language
inglise
Ubar, R., Tsertov, A., Jasnetski, A., Brik, M. Software-based self-test generation for microprocessors with high-level decision diagrams // LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014. [S.l.] : IEEE, 2014. [6] p. : ill.