Ubar, R., Tsertov, A., Jasnetski, A., Brik, M.

full record print

Software-based self-test generation for microprocessors with high-level decision diagrams

author

Ubar, Raimund-Johannes

Tšertov, Anton

Jasnetski, Artjom

Brik, Marina

statement of authorship

Raimund Ubar, Anton Tsertov, Artjom Jasnetski, Marina Brik

source

LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014

location of publication

[S.l.]

publisher

IEEE

year of publication

2014

pages

[6] p. : ill

conference name, date

15th IEEE Latin-American Test Workshop, March 12-15, 2014

conference location

Fortaleza, Brazil

ISBN

978-1-4799-4711-9

notes

Bibliogr.: 22 ref

TTÜ department

arvutitehnika instituut

language

inglise

Märksõnad ja võtmesõnad

subject term

mikroprotsessorid

testimine

otsustusdiagrammid

programmigeneraatorid

keyword

microprocessor

software-based self-test (SBST)

test program generation

high-level decision diagrams

Ubar, R., Tsertov, A., Jasnetski, A., Brik, M. Software-based self-test generation for microprocessors with high-level decision diagrams // LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014. [S.l.] : IEEE, 2014. [6] p. : ill.