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Exact static compaction of independent test sequences (title)
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book article
Exact static compaction of independent test sequences
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 315-318 : ill
book article
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keyword
5
1.
deterministic test sequences
2.
implementation-independent test generation
3.
rtioco-based timed test sequences
4.
static load test
5.
static-dynamic probing test (SDT)
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