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Mixed-level defect simulation in data-paths of digital systems (title)
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book article
Mixed-level defect simulation in data-paths of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 617-620 : ill
https://ieeexplore.ieee.org/document/1003333
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keyword
13
1.
Cross-level Modeling of Faults in Digital Systems
2.
High-level Decision Diagrams for Modeling Digital Systems
3.
high-level fault simulation
4.
register transfer and gate level simulation
5.
system level simulation
6.
data simulation
7.
digital real time simulation
8.
digital shipping simulation
9.
high-level test data generation
10.
level-crossing analog-to-digital converters
11.
level-crossing analogue-to-digital converters (ADC)
12.
Multi-valued Simulation for Hazard Detection in Digital Circuits
13.
digital data exchange
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