Mixed-level defect simulation in data-paths of digital systems
statement of authorship
R.Ubar, J.Raik, E.Ivask, M.Brik
location of publication
[S.l.]
publisher
year of publication
pages
p. 617-620 : ill
ISBN
0-7803-7235-2
notes
Bibliogr.: 8 ref
language
inglise
Ubar, R.-J., Raik, J., Ivask, E., Brik, M. Mixed-level defect simulation in data-paths of digital systems // 23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2. [S.l.] : IEEE Electron Devices Society, 2002. p. 617-620 : ill.