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IEEE Electron Devices Society (publisher)
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1
book article
An approach to synthesis of mixed synchronous/asynchronous digital devices
Sudnitsõn, Aleksander
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings
2002
/
p. 695-698
book article
2
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 659-662 : ill
https://ieeexplore.ieee.org/document/1003344
book article
3
book article
Low power synthesis based on information theoretic measures
Fomina, Jelena
;
Keevallik, Andres
;
Sudnitsõn, Aleksander
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings
2002
/
p. 699-702
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1003354
book article
4
book article
Mixed-level defect simulation in data-paths of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 617-620 : ill
https://ieeexplore.ieee.org/document/1003333
book article
5
book article
Multi-valued simulation of digital circuits
Ubar, Raimund-Johannes
Proceedings : 1997 21st International Conference on Microelectronics : Niš, Yugoslavia, 14-17 September 1997. Vol. 2
1997
/
p. 721-724 : ill
book article
6
book article
On efficient logic-level simulation of digital circuits represented by the SSBDD model
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 621-624 : ill
https://ieeexplore.ieee.org/document/1003334
book article
Number of records 6, displaying
1 - 6
keyword
64
1.
Auger electron spectroscopy
2.
electron
3.
electron backscatter diffraction (EBSD)
4.
electron backscattered diffraction analysis
5.
electron beam induced current
6.
electron beam melting
7.
Electron beams
8.
electron density measurement
9.
electron donor number
10.
electron donor-acceptor complex
11.
electron guns
12.
electron holography
13.
electron irradiation
14.
electron linear accelerator
15.
electron microscopeGrain sizeHolocene Thermal MaximumBaltic SeaGulf of Riga
16.
electron microscopy
17.
electron phonon interaction
18.
electron tomography
19.
electron transport layer
20.
electron transport layers
21.
electron transporting materials
22.
electron-phonon interaction
23.
lone pair electron
24.
scanning electron microscope
25.
scanning electron microscopy
26.
selective electron beam melting
27.
single electron transfer
28.
TiO2 electron transport layer
29.
transmission electron microscopy
30.
acoustic devices
31.
bi-directional fault monitoring devices
32.
biomedical devices
33.
cardiac implantable electronic devices
34.
cardiac implanted electronic devices
35.
chirality devices
36.
configurable protection devices
37.
constrained devices
38.
devices for energy harvesting
39.
electronic devices
40.
embedded devices
41.
energy storage devices
42.
FACTs devices
43.
GaAs power devices
44.
homecare medical devices
45.
implanted devices
46.
In vitro diagnostic medical devices
47.
intelligent electronic devices
48.
lab-on-chip devices
49.
medical devices
50.
microfluidic devices
51.
miniaturized devices
52.
on-scene available devices
53.
peripheral devices
54.
power devices
55.
power semiconductor devices
56.
resource-constrained devices
57.
semiconductor devices
58.
series Protection devices
59.
smart autonomous devices
60.
smart devices
61.
testing of digital devices
62.
thermoelectric devices
63.
wearable devices
64.
wide band gap semiconductor devices
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