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International Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings (source)

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Multiple-objective backtrace for solving test generation constraintsMekler, A.; Raik, JaanInternational Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings2003 / p. 123-126 : ill https://ieeexplore.ieee.org/document/1267732

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