Efficient at-speed interconnect BIST and diagnosis framework
author
statement of authorship
Artur Jutman
source
location of publication
[Tallinn]
publisher
year of publication
pages
p. 257-258 : ill
notes
Bibliogr.: 8 ref
language
inglise
Jutman, A. Efficient at-speed interconnect BIST and diagnosis framework // Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005. [Tallinn] : [Tallinn University of Technology], 2005. p. 257-258 : ill.