Skobtsov, Y.A., Ivanov, D.E., Skobtsov, V.Y., Ubar, R., Raik, J.

full record print

Evolutionary approach to test generation for functional BIST

author

Skobtsov, Y.A.

Ivanov, D.E.

Skobtsov, V.Y.

Ubar, Raimund-Johannes

Raik, Jaan

statement of authorship

Y.A.Skobtsov, D.E.Ivanov, V.Y.Skobtsov, R.Ubar, J.Raik

source

Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005

location of publication

[Tallinn]

publisher

[Tallinn University of Technology]

year of publication

2005

pages

p. 151-155 : ill

url

https://artiklid.elnet.ee/record=b1018764*est

notes

Bibliogr.: 11 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

elektronlülitused

teimimine

raalteimimine

Skobtsov, Y.A., Ivanov, D.E., Skobtsov, V.Y., Ubar, R., Raik, J. Evolutionary approach to test generation for functional BIST // Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005. [Tallinn] : [Tallinn University of Technology], 2005. p. 151-155 : ill. https://artiklid.elnet.ee/record=b1018764*est