The 23rd International Conference on Defects in Semiconductors : ICDS-23 : Awaji island, Japan, July 24 - July 29, 2005 : program and abstracts (source)

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    High temperature investigation of ZnS:Ga and CdSe:GaLott, Kalju; Nirk, Tiit; Volobujeva, Olga; Šinkarenko, Svetlana; Grebennik, A.; Vishnjakov, A.The 23rd International Conference on Defects in Semiconductors : ICDS-23 : Awaji island, Japan, July 24 - July 29, 2005 : program and abstracts2005 / p. 210 : ill
    book article
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