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An external test approach for network-on-a-chip switches (title)
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book article
An external test approach for network-on-a-chip switches
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
ATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan
2006
/
p. 437-442 : ill
http://dx.doi.org/10.1109/ATS.2006.23
book article
2
book article
An external test approach for network-on-a-chip switches
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
2011
/
p. 185-190 : ill
book article
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keyword
8
1.
network on chip
2.
Network on Chip (NoC)
3.
network-on-chip
4.
Chip-to-chip authentication
5.
low voltage stresses on switches and diodes
6.
MOSFET switches
7.
power semiconductor switches
8.
switches
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