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93101
book article
Test generation with structurally synthesized BDD models
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 1998
1998
/
p. 66-68
book article
93102
book article
Test method for determining radiation absorptivity and emissivity coefficients of ACSR conductors
Kiitam, Ivar
18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]
2019
/
p. 185-186 : ill
https://www.ester.ee/record=b5183874*est
book article
93103
journal article
Test method for the total content of non-volatile phenols in wastewater
Johannes, Ille
;
Mölder, Leevi
;
Tiikma, Laine
Oil shale
1998
/
3, p. 232-238
journal article
93104
journal article
Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols
Bengtsson, Tomas
;
Kumar, Shashi
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Peng, Zebo
IET computers and digital techniques
2008
/
6, p. 445-460
journal article
93105
book article
Test methods for determination of design parameters for fasteners
Franke, Steffen
;
Franke, Bettina
;
Tuhkanen, Eero
Design of connections in timber structures : a state-of-the-art report by COST action FP1402/WG3
2018
/
p. 33–59 : ill
https://www.costfp1402.tum.de/fileadmin/w00btl/www/All_Members/Sandhaas__C.__Munch-Andersen__J._Dietsch__P.__Design_of_Connections_in_Timber_Structures.pdf
book article
93106
book article
Test pattern generation at the behavioral level from VHDL circuit description containing several processes
Gramatova, Elena
;
Bezakova, Jana
;
Cibakova, Tatiana
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 145-148
book article
93107
book article
Test pattern generation for microprocessor systems on the alternative graph model
Ubar, Raimund-Johannes
Proceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 1983
1985
/
p. 403-410
book article
93108
dissertation
Test program generation for microprocessor systems
Dušina, Julia
1993
https://www.ester.ee/record=b2090526*est
dissertation
93109
book article
Test results of practical value-centric business development methodology
Randmaa, Merili
;
Otto, Tauno
;
Howard, Thomas J.
Proceedings of NordDesign 2014 Conference
2014
/
p. 642-651 : ill
book article
93110
book article
Test scenario generator learning for model-based testing of mobile robots
Kanter, Gert
;
Liibert, Marti Ingmar
System assurances : modeling and management
2022
/
p. 67-84
https://doi.org/10.1016/B978-0-323-90240-3.00005-9
book article
93111
journal article EST
/
journal article ENG
Test scenario specification language for model-based testing
Halling, Evelin
;
Vain, Jüri
;
Boyarchuk, Artem
;
Illiashenko, Oleg
International Journal of Computing
2019
/
p. 408-421 : ill
http://www.computingonline.net/computing/article/view/1611
https://doi.org/10.47839/ijc.18.4.1611
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
93112
book article
Test set minimization using bipartite graphs
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 175-178: ill
book article
93113
book article
Test setup for measuring medium voltage power cable and joint temperature in high current tests using thermocouples [Online resource]
Taklaja, Paul
;
Kiitam, Ivar
;
Hyvönen, Petri
;
Klüss, Joni
34th Electrical Insulation Conference : Hotel Bonaventure, Montreal, Qc, Canada, 19-22 June 2016 : proceedings
2016
/
p. 480-483 : ill
https://doi.org/10.1109/EIC.2016.7548642
book article
93114
book article
Test strategy for a 486 computer multichip module
Magnhagen, Bengt
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 339-340: ill
book article
93115
book article
Test synthesis from register-transfer level descriptions
Raik, Jaan
;
Paomets, Priidu
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 311-314: ill
book article
93116
journal article
Test synthesis with alternative graphs
Ubar, Raimund-Johannes
IEEE design & test of computers
1996
/
Spring, p. 48-57: ill
journal article
93117
journal article
Test system for fault detection and diagnosis in microprocessor control devices
Ubar, Raimund-Johannes
;
Lohuaru, Tõnu
;
Männisalu, Mati
;
Pukk, P.
;
Vanamölder, E.
Tallinna Tehnikaülikooli Toimetised
1990
/
lk. 63-77: ill
journal article
93118
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
book article
93119
journal article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Journal of computer science and technology
2006
/
6, p. 907-912 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
journal article
93120
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
book article
93121
newspaper article
TEST: Gümnaasiumi maateaduse olümpiaadi küsimused [Võrguväljaanne]
postimees.ee
2021
"TEST: Gümnaasiumi maateaduse olümpiaadi küsimused"
newspaper article
93122
newspaper article
TEST: Kui hästi tunned meditsiinitehnoloogiat? [Võrguväljaanne]
postimees.ee
2021
"TEST: Kui hästi tunned meditsiinitehnoloogiat?"
newspaper article
93123
newspaper article
TEST: Kui palju tead energeetikast? [Võrguväljaanne]
postimees.ee
2021
"TEST: Kui palju tead energeetikast?"
newspaper article
93124
book article
Testability analysis for efficient register-transfer level test generation [Electronic resource]
Nõmmeots, Tanel
;
Raik, Jaan
;
Ubar, Raimund-Johannes
9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 2002
2002
/
[4] p. [CD-ROM]
book article
93125
book article
Testability analysis of digital design verification
Hahanov, V.
;
Kaminska, M.
;
Fomina, Jelena
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 171-174 : ill
book article
Number of records 131718, displaying
93101 - 93125
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