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93101
book article
Test pattern generation at the behavioral level from VHDL circuit description containing several processes
Gramatova, Elena
;
Bezakova, Jana
;
Cibakova, Tatiana
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 145-148
book article
93102
book article
Test pattern generation for microprocessor systems on the alternative graph model
Ubar, Raimund-Johannes
Proceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 1983
1985
/
p. 403-410
book article
93103
dissertation
Test program generation for microprocessor systems
Dušina, Julia
1993
https://www.ester.ee/record=b2090526*est
dissertation
93104
book article
Test results of practical value-centric business development methodology
Randmaa, Merili
;
Otto, Tauno
;
Howard, Thomas J.
Proceedings of NordDesign 2014 Conference
2014
/
p. 642-651 : ill
book article
93105
book article
Test scenario generator learning for model-based testing of mobile robots
Kanter, Gert
;
Liibert, Marti Ingmar
System assurances : modeling and management
2022
/
p. 67-84
https://doi.org/10.1016/B978-0-323-90240-3.00005-9
book article
93106
journal article EST
/
journal article ENG
Test scenario specification language for model-based testing
Halling, Evelin
;
Vain, Jüri
;
Boyarchuk, Artem
;
Illiashenko, Oleg
International Journal of Computing
2019
/
p. 408-421 : ill
http://www.computingonline.net/computing/article/view/1611
https://doi.org/10.47839/ijc.18.4.1611
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
93107
book article
Test set minimization using bipartite graphs
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 175-178: ill
book article
93108
book article
Test setup for measuring medium voltage power cable and joint temperature in high current tests using thermocouples [Online resource]
Taklaja, Paul
;
Kiitam, Ivar
;
Hyvönen, Petri
;
Klüss, Joni
34th Electrical Insulation Conference : Hotel Bonaventure, Montreal, Qc, Canada, 19-22 June 2016 : proceedings
2016
/
p. 480-483 : ill
https://doi.org/10.1109/EIC.2016.7548642
book article
93109
book article
Test strategy for a 486 computer multichip module
Magnhagen, Bengt
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 339-340: ill
book article
93110
book article
Test synthesis from register-transfer level descriptions
Raik, Jaan
;
Paomets, Priidu
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 311-314: ill
book article
93111
journal article
Test synthesis with alternative graphs
Ubar, Raimund-Johannes
IEEE design & test of computers
1996
/
Spring, p. 48-57: ill
journal article
93112
journal article
Test system for fault detection and diagnosis in microprocessor control devices
Ubar, Raimund-Johannes
;
Lohuaru, Tõnu
;
Männisalu, Mati
;
Pukk, P.
;
Vanamölder, E.
Tallinna Tehnikaülikooli Toimetised
1990
/
lk. 63-77: ill
journal article
93113
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
book article
93114
journal article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Journal of computer science and technology
2006
/
6, p. 907-912 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
journal article
93115
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
book article
93116
newspaper article
TEST: Gümnaasiumi maateaduse olümpiaadi küsimused [Võrguväljaanne]
postimees.ee
2021
"TEST: Gümnaasiumi maateaduse olümpiaadi küsimused"
newspaper article
93117
newspaper article
TEST: Kui hästi tunned meditsiinitehnoloogiat? [Võrguväljaanne]
postimees.ee
2021
"TEST: Kui hästi tunned meditsiinitehnoloogiat?"
newspaper article
93118
newspaper article
TEST: Kui palju tead energeetikast? [Võrguväljaanne]
postimees.ee
2021
"TEST: Kui palju tead energeetikast?"
newspaper article
93119
book article
Testability analysis for efficient register-transfer level test generation [Electronic resource]
Nõmmeots, Tanel
;
Raik, Jaan
;
Ubar, Raimund-Johannes
9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 2002
2002
/
[4] p. [CD-ROM]
book article
93120
book article
Testability analysis of digital design verification
Hahanov, V.
;
Kaminska, M.
;
Fomina, Jelena
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 171-174 : ill
book article
93121
book article
Testability calculation for digital circuits with decision diagrams
Ubar, Raimund-Johannes
3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers
2002
/
p. 137-143 : ill
book article
93122
book article
Testability guided hierarchical test generation with decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Nõmmeots, Tanel
20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002
2002
/
p. 265-271
book article
93123
book article
Testability-based parameter measurement of analog measuring circuits in the frequency domain
Liu, Ji-Gou
;
Frühauf, Uwe
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 329-332: ill
book article
93124
journal article
Testaliin - uus püüniste peitsimisvahend ja selle tarvitamine
Tiitus, B.
Eesti Kalandus
1939
/
lk. 133-135
journal article
93125
book article
Testentwicklung für Mikroprozessorsystem mit Hilfe der alternativen Graphen
Alango, Villem
;
Kont, Toomas
;
Ubar, Raimund-Johannes
33. Internationales wissenschaftliches Kolloquium : 24.-28.10.1988. H.1.
1988
/
S- 11-14
https://www.ester.ee/record=b2936968*est
book article
Number of records 131713, displaying
93101 - 93125
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