RT-level identification of potentially testable initialization faults
statement of authorship
J.Raik, H.Fujiwara, A.Krivenko
source
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
location of publication
Sapporo
year of publication
pages
[6] p
Raik, J., Fujiwara, H., Krivenko, A. RT-level identification of potentially testable initialization faults // The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan. Sapporo, 2008. [6] p.