Viilukas, T., Karputkin, A., Raik, J., Jenihhin, M., Ubar, R., Fujiwara, H.

full record print

Identifying untestable faults in sequential circuits using test path constraints

author

Viilukas, Taavi

Karputkin, Anton

Raik, Jaan

Jenihhin, Maksim

Ubar, Raimund-Johannes

Fujiwara, Hideo

statement of authorship

Taavi Viilukas, Anton Karputkin, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Hideo Fujiwara

source

Journal of electronic testing : theory and applications (JETTA)

journal volume number month

Vol. 28, 4

year of publication

2012

pages

p. 511-521 : ill

url

https://link.springer.com/article/10.1007/s10836-012-5312-5

ISSN

0923-8174

notes

Bibliogr.: 23 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

elektriahelad

vead

diagnostika (tehnika)

keyword

automated test pattern generation

untestable faults

Viilukas, T., Karputkin, A., Raik, J., Jenihhin, M., Ubar, R., Fujiwara, H. Identifying untestable faults in sequential circuits using test path constraints // Journal of electronic testing : theory and applications (JETTA) (2012) Vol. 28, 4, p. 511-521 : ill. https://link.springer.com/article/10.1007/s10836-012-5312-5