Modeling microprocessor faults on high-level decision diagrams [Electronic resource]
author
statement of authorship
Raimund Ubar, Jaan Raik, Artur Jutman, Maksim Jenihhin, Martin Istenberg, Heinz-Dietrich Wuttke
source
DSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska
location of publication
[S.l.]
year of publication
pages
p. C17-C22 : ill. [CD-ROM]
subject term
notes
Bibliogr.: 24 ref
language
inglise
Ubar, R.-J., Raik, J., Jutman, A., Jenihhin, M., Istenberg, M., Wuttke, H.-D. Modeling microprocessor faults on high-level decision diagrams [Electronic resource] // DSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska. [S.l.], 2008. p. C17-C22 : ill. [CD-ROM].