Hierarchical test generation based on alternative graph model
author
statement of authorship
R. Ubar
source
Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995
location of publication
Duisburg
publisher
Gerhard-Mercator-Universität-GH Duisburg, Institut für Informatik
year of publication
pages
p. 18
series
Schriftenreihe Informatik ; 15
conference name, date
Second Workshop on Hierarchical Test Generation: Microelectronics Technology Park, September 25-26, 1995
conference location
Duisburg, Germany
ISSN
0942-4164
language
inglise
Ubar, R. Hierarchical test generation based on alternative graph model // Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995. Duisburg : Gerhard-Mercator-Universität-GH Duisburg, Institut für Informatik, 1995. p. 18. (Schriftenreihe Informatik ; 15).