prindi

Hierarchical test generation based on alternative graph model

autor
Ubar, Raimund-Johannes
vastutusandmed
R. Ubar
allikas
Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995
ilmumiskoht
Duisburg
kirjastus/väljaandja
Gerhard-Mercator-Universität-GH Duisburg, Institut für Informatik
ilmumisaasta
1995
leheküljed
p. 18
seeria-sari
Schriftenreihe Informatik ; 15
konverentsi nimetus, aeg
Second Workshop on Hierarchical Test Generation: Microelectronics Technology Park, September 25-26, 1995
konverentsi toimumispaik
Duisburg, Germany
märksõna
testimine
testid
graafid
mudelid
ISSN
0942-4164
keel
inglise
Ubar, R. Hierarchical test generation based on alternative graph model // Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995. Duisburg : Gerhard-Mercator-Universität-GH Duisburg, Institut für Informatik, 1995. p. 18. (Schriftenreihe Informatik ; 15).