JÄNES : a NAS framework for ML-based EDA applications
statement of authorship
Hardi Selg, Maksim Jenihhin, Peeter Ellervee
source
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
publisher
year of publication
conference name, date
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 06-08 October 2021
conference location
Athens, Greece
ISSN
2765-933X
ISBN
978-1-6654-1609-2
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
classifier
Selg, H., Jenihhin, M., Ellervee, P. JÄNES : a NAS framework for ML-based EDA applications // IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. : IEEE, 2021.