A constraint-driven gate-level test generator
statement of authorship
Jaan Raik, Raimund Ubar, Gert Jervan, Helena Krupnova
location of publication
[Tallinn]
year of publication
pages
p. 237-240: ill
ISBN
9985-59-026-0
notes
Bibl. 9 ref
Raik, J., Ubar, R., Jervan, G., Krupnova, H. A constraint-driven gate-level test generator // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 237-240: ill.