Raik, J., Ubar, R., Jervan, G., Krupnova, H.

full record print

A constraint-driven gate-level test generator

author

Raik, Jaan

Ubar, Raimund-Johannes

Jervan, Gert

Krupnova, Helena

statement of authorship

Jaan Raik, Raimund Ubar, Gert Jervan, Helena Krupnova

source

BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1996

pages

p. 237-240: ill

ISBN

9985-59-026-0

notes

Bibl. 9 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

generaatorid

testimine

digitaaltehnika

Raik, J., Ubar, R., Jervan, G., Krupnova, H. A constraint-driven gate-level test generator // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 237-240: ill.