Damljanovic, A., Squillero, G., Gürsoy, C. C., Jenihhin, M.

full record print

On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networks

author

Damljanovic, Aleksa

Squillero, Giovanni

Gürsoy, Cemil Cem

Jenihhin, Maksim

statement of authorship

Aleksa Damljanovic, Giovanni Squillero, Cemil Cem Güursoy, Maksim Jenihhin

source

VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]

location of publication

Piscataway

publisher

IEEE

year of publication

2019

pages

p. 335-340 : ill

conference name, date

27th IFIP/IEEE International Conference on Very Large Scale Integration, October 6-9, 2019

conference location

Cusco, Peru

url

https://doi.org/10.1109/VLSI-SoC.2019.8920313

ISSN

2324-8440

2324-8432

ISBN

978-1-7281-3915-9

978-1-7281-3916-6

notes

Bibliogr.: 22 ref

TalTech department

arvutisüsteemide instituut

language

inglise

Märksõnad ja võtmesõnad

subject term

nanoelektroonika

rikked

keyword

IJTAG

NBTI

aging

mitigation

Reserch Group

Centre for trustworthy and efficient computing hardware (TECH)

Centre of dependable computing systems

Damljanovic, A., Squillero, G., Gürsoy, C. C., Jenihhin, M. On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networks // VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]. Piscataway : IEEE, 2019. p. 335-340 : ill. https://doi.org/10.1109/VLSI-SoC.2019.8920313