Fault collapsing with linear complexity in digital circuits
statement of authorship
R. Ubar, D.Mironov, J.Raik, A.Jutman
source
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France
location of publication
[S.l.]
publisher
year of publication
pages
p. 653-656 : ill
conference name, date
2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010
conference location
Paris, France
ISBN
978-1-4244-5308-5
notes
Bibliogr.: 25 ref
language
inglise
subject term
Ubar, R., Mironov, D., Raik, J., Jutman, A. Fault collapsing with linear complexity in digital circuits // Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France. [S.l.] : IEEE, 2010. p. 653-656 : ill.