prindi

Fault collapsing with linear complexity in digital circuits

autor
Ubar, Raimund-Johannes
Mironov, Dmitri
Raik, Jaan
Jutman, Artur
vastutusandmed
R. Ubar, D.Mironov, J.Raik, A.Jutman
allikas
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IEEE
ilmumisaasta
2010
leheküljed
p. 653-656 : ill
konverentsi nimetus, aeg
2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010
konverentsi toimumispaik
Paris, France
leitav
https://ieeexplore.ieee.org/document/5537504
märksõna
integraallülitused
testimine
rikked
ISBN
978-1-4244-5308-5
märkused
Bibliogr.: 25 ref
keel
inglise
Ubar, R., Mironov, D., Raik, J., Jutman, A. Fault collapsing with linear complexity in digital circuits // Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France. [S.l.] : IEEE, 2010. p. 653-656 : ill. https://ieeexplore.ieee.org/document/5537504