High-level design error diagnosis using backtrace on decision diagrams
statement of authorship
Jaan Raik, Urmas Repinski, Raimund Ubar, Maksim Jenihhin, Anton Chepurov
source
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
location of publication
[S.l.]
publisher
year of publication
pages
[4] p. : ill
conference name, date
28th Norchip Conference, 15-16 November, 2010
conference location
Tampere, Finland
ISBN
978-1-4244-8973-2
notes
Bibliogr.: 12 ref
TTÜ department
language
inglise
Raik, J., Repinski, U., Ubar, R., Jenihhin, M., Tšepurov, A. High-level design error diagnosis using backtrace on decision diagrams // 28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers. [S.l.] : IEEE, 2010. [4] p. : ill.