Hierarchical test generation for digital systems
statement of authorship
Marina Brik, Gert Jervan, Antti Markus, Jaan Raik and Raimund Ubar
location of publication
Boston
publisher
year of publication
pages
p. 131-136: ill
ISBN
0-7923-8116-5
notes
Bibl. 15 ref
Brik, M., Jervan, G., Markus, A., Raik, J., Ubar, R. Hierarchical test generation for digital systems // Mixed design of integrated circuits and systems. Boston : Kluwer Academic Publishers, 1998. p. 131-136: ill.