Brik, M., Jervan, G., Markus, A., Raik, J., Ubar, R.

full record print

Hierarchical test generation for digital systems

author

Brik, Marina

Jervan, Gert

Markus, Antti

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

Marina Brik, Gert Jervan, Antti Markus, Jaan Raik and Raimund Ubar

source

Mixed design of integrated circuits and systems

location of publication

Boston

publisher

Kluwer Academic Publishers

year of publication

1998

pages

p. 131-136: ill

url

https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_20

ISBN

0-7923-8116-5

notes

Bibl. 15 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

digitaaltehnika

testimine

graafid

mudelid

Brik, M., Jervan, G., Markus, A., Raik, J., Ubar, R. Hierarchical test generation for digital systems // Mixed design of integrated circuits and systems. Boston : Kluwer Academic Publishers, 1998. p. 131-136: ill. https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_20