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Hierarchical test generation. SEMI show slides

author
Ubar, Raimund-Johannes
Raik, Jaan
statement of authorship
R. Ubar, J. Raik
source
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
location of publication
[S.l.]
publisher
SEMI
year of publication
1999
pages
p. 53-64
subject term
testimine
testid
digitaaltehnika
language
inglise
Ubar, R., Raik, J. Hierarchical test generation. SEMI show slides // "Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999. [S.l.] : SEMI, 1999. p. 53-64.