Ubar, R., Raik, J. - TalTech Research Portal

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Hierarchical test generation. SEMI show slides

author

Ubar, Raimund-Johannes

Raik, Jaan

statement of authorship

R. Ubar, J. Raik

source

"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999

location of publication

[S.l.]

publisher

SEMI

year of publication

1999

pages

p. 53-64

language

inglise

Märksõnad ja võtmesõnad

subject term

testimine

testid

digitaaltehnika

Ubar, R., Raik, J. Hierarchical test generation. SEMI show slides // "Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999. [S.l.] : SEMI, 1999. p. 53-64.