Azad, S.P., Niazmand, B., Apneet Kaur, Raik, J., Jervan, G., Hollstein, T.

Automated area and coverage optimization of minimal latency checkers

author

Azad, Siavoosh Payandeh

Niazmand, Behrad

Apneet Kaur

Raik, Jaan

Jervan, Gert

Hollstein, Thomas

statement of authorship

Siavoosh Payandeh Azad, Behrad Niazmand, Apneet Kaur Sandhu, Jaan Raik, Gert Jervan, Thomas Hollstein

source

2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings

location of publication

Piscataway

publisher

IEEE

year of publication

2017

pages

p. 7-8 : ill

conference name, date

22nd IEEE European Test Symposium (ETS 2017), 22 - 26 May 2017

conference location

Limassol, Cyprus

url

https://doi.org/10.1109/ETS.2017.7968211

subject term

nanoelektroonika

rikked

ISSN

1530-1877

ISBN

978-1-5090-5458-9

notes

Bibliogr.: 5 ref

TTÜ department

arvutisüsteemide instituut

language

inglise

Azad, S.P., Niazmand, B., Apneet Kaur, Raik, J., Jervan, G., Hollstein, T. Automated area and coverage optimization of minimal latency checkers // 2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings. Piscataway : IEEE, 2017. p. 7-8 : ill. https://doi.org/10.1109/ETS.2017.7968211