SiC-diodes forward surge current failure mechanisms : experiment and simulation
author
statement of authorship
A.Udal and E.Velmre
source
Microelectronics and reliability
journal volume number month
Vol. 37
year of publication
pages
10/11, p. 1671-1674
subject term
ISSN
0026-2714
language
inglise
Udal, A., Velmre, E. SiC-diodes forward surge current failure mechanisms : experiment and simulation // Microelectronics and reliability (1997) Vol. 37, 10/11, p. 1671-1674.