RT-level identification of potentially testable initialization faults
autor
Raik, Jaan
Fujiwara, Hideo
Krivenko, Anna
vastutusandmed
J.Raik, H.Fujiwara, A.Krivenko
allikas
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
ilmumiskoht
Sapporo
ilmumisaasta
2008
leheküljed
[6] p
leitav
https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults
märksõna
rikked
avastamine
testimine
keel
inglise