Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interface
autor
vastutusandmed
D.Kropman, E.Mellikov, K.Lott, T.Kärner, I.Heinmaa, T.Laas, A.Medvid, W.Skroupa, S.Prucnal, S.Zvyagin, E.Cizmar, M.Ozerov, J.Wosnitsa
allikas
ajakirja aastakäik number kuu
Vol. 156/158
ilmumisaasta
leheküljed
p. 145-148 : ill
ISSN
1012-0394
märkused
Bibliogr.: 3 ref
keel
inglise
Kropman, D., Mellikov, E., Lott, K., Kärner, T., Heinmaa, I., Laas, T., Medvid, A., Skroupa, W., Prucnal, S., Zvyagin, S., Cizmar, E., Ozerov, M., Wosnitsa, J. Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interface // Solid state phenomena (2010) Vol. 156/158, p. 145-148 : ill.