Failure prediction of power devices under reverse surge current conditions
autor
vastutusandmed
Boris Freydin, Enn Velmre, and Andres Udal
allikas
ISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 1992
ilmumiskoht
Tokyo
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 118-123: fig
konverentsi nimetus, aeg
The 4th International Symposium on Power Semiconductor Devices, May 1992
konverentsi toimumispaik
Waseda University, Tokyo
märksõna
võtmesõna
Surges
Poisson equations
Electronic packaging thermal management
Semiconductor device packaging
Charge carrier processes
Freydin, B., Velmre, E., Udal, A. Failure prediction of power devices under reverse surge current conditions // ISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 1992. Tokyo : IEEE, 1992. p. 118-123: fig.