prindi

Design error diagnosis in scan-path designs

autor
Ubar, Raimund-Johannes
vastutusandmed
Raimund Ubar
allikas
2nd IEEE Latin American Test Workshop : LATW 2001 : Cancun, Mexico, February 11-14, 2001 : digest of papers
ilmumiskoht
[S. l.]
ilmumisaasta
2001
leheküljed
p. 162-168 : ill
märksõna
rikked
diagnostika (tehnika)
disain
skaneerimine
märkused
Bibliogr.: 16 ref
keel
inglise
Ubar, R.-J. Design error diagnosis in scan-path designs // 2nd IEEE Latin American Test Workshop : LATW 2001 : Cancun, Mexico, February 11-14, 2001 : digest of papers. [S. l.], 2001. p. 162-168 : ill.