Durability performance of semiconductor strain gauges in GFRP laminate
vastutusandmed
Henrik Herranen, Tõnis Saar, Rauno Gordon, Meelis Pohlak, Henri Lend
allikas
Proceedings of the 6th ECCOMAS Thematic Conference on Smart Structures and Materials, SMART 2013 : Turin, Italy, June 24-26, 2013
ilmumiskoht
Torino
kirjastus/väljaandja
Politecnico di Torino
ilmumisaasta
leheküljed
p. 1-14 : ill
konverentsi nimetus, aeg
6th ECCOMAS Conference on Smart Structures and Materials SMART 2013, 24-26 June, 2013
konverentsi toimumispaik
Turin, Italy
märkused
Bibliogr.: 14 ref
TTÜ struktuuriüksus
keel
inglise
võtmesõna
silicon strain gauge
embedded sensor
hygrothermal conditions
Herranen, H., Saar, T., Gordon, R., Pohlak, M., Lend, H. Durability performance of semiconductor strain gauges in GFRP laminate // Proceedings of the 6th ECCOMAS Thematic Conference on Smart Structures and Materials, SMART 2013 : Turin, Italy, June 24-26, 2013. Torino : Politecnico di Torino, 2013. p. 1-14 : ill.