Universal mitigation of NBTI-induced aging by design randomization
autor
vastutusandmed
Maksim Jenihhin, Alexander Kamkin, Zainalabedin Navabi, Somayeh Sadeghi-Kohan
allikas
Proceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 2016
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
[5] p. : ill
konverentsi nimetus, aeg
2016 IEEE East-West Design and Test Symposium, EWDTS 2016, October 14-17, 2016
konverentsi toimumispaik
Yerevan, Armenia
ISSN
2472-761X
ISBN
978-1-5090-0693-9
märkused
Bibliogr.: 28 ref
TTÜ struktuuriüksus
keel
inglise
Jenihhin, M., Kamkin, A., Navabi, Z., Sadeghi-Kohan, S. Universal mitigation of NBTI-induced aging by design randomization // Proceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 2016. [S.l.] : IEEE, 2017. [5] p. : ill.