Otsing - TalTech teadusportaal

kuva

reasta

1

artikkel kogumikus

Algorithm for restructuring of structurally synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes2019 IEEE 31st International Conference on Microelectronics : Niš, Serbia September 16th-18th, 2019 : proceedings2019 / p. 239-242 : ill https://doi.org/10.1109/MIEL.2019.8889578

artikkel kogumikus

2

artikkel kogumikus

Application specific true critical paths identification in sequential circuitsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Oyeniran, Adeboye Stephen2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 299-304 : ill https://doi.org/10.1109/IOLTS.2019.8854442

artikkel kogumikus

3

artikkel kogumikus

Engineering of an effective automatic dynamic assertion mining platformGhasempouri, Tara; Malburg, Jan; Danese, Alessandro; Pravadelli, Graziano; Fey, Goerschwin; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 111-116 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920331

artikkel kogumikus

4

artikkel kogumikus

Gate-level graph representation learning : a step towards the improved stuck-at faults analysisBalakrishnan, Aneesh; Alexandrescu, Dan; Jenihhin, Maksim; Lange, Thomas; Glorieux, MaximilienProceedings of the Twenty Second International Symposium on Quality Electronic Design (ISQED) : Santa Clara, USA, 7-9 April 20212021 / p. 24-30 https://doi.org/10.1109/ISQED51717.2021.9424256

artikkel kogumikus

Seotud publikatsioonid 1

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

5

artikkel kogumikus

Modeling soft-error reliability under variabilityBalakrishnan, Aneesh; Cardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Hamdioui, Said; Jenihhin, Maksim; Alexandrescu, Dan2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 20212021 / p. 1-6 https://doi.org/10.1109/DFT52944.2021.9568295

artikkel kogumikus

Seotud publikatsioonid 1