Raun, L. (autor)

teaviku laadid

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  • artikkel kogumikus
    Calculation of testability measures on structurally synthesized binary decision diagramsUbar, Raimund-Johannes; Heinlaid, J.; Raik, Jaan; Raun, L.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 179-182: ill
    artikkel kogumikus
  • artikkel kogumikus
    Improved testability calculation for digital circuitsUbar, Raimund-Johannes; Heinlaid, J.; Raun, L.19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings2001 / p. 264-270 : ill
    artikkel kogumikus
Kirjeid leitud 2, kuvan 1 - 2