Test driven domain modelling
vastutusandmed
Gunnar Piho, Jaak Tepandi, Marko Parman, Viljam Puusep and Mart Roost
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 576-581
konverentsi nimetus, aeg
MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011
konverentsi toimumispaik
Opatija, Croatia
ISBN
978-953-233-067-0
978-1-4577-0996-8
märkused
Bibliogr.: 25 ref
keel
inglise
märksõna
võtmesõna
domain analysis and engineering
domain model and domain modelling
test driven development
test driven modelling
verification and validation
Piho, G., Tepandi, J., Parman, M., Puusep, V., Roost, M. Test driven domain modelling // MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings. [S.l.] : MIPRO, 2011. p. 576-581.