Otsing - TalTech teadusportaal

artikkel ajakirjas

Compact two-element transmission trap detector for 1550 nm wavelengthVaigu, Aigar; Kübarsepp, Toomas; Manoocheri, FarshidMeasurement science and technology2015 / p. 1-6 : ill

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artikkel kogumikus

High-accuracy eddy current measurements of metalsMärtens, Olev; Land, Raul; Rist, Marek; Pokatilov, Andrei2014 IEEE International Workshop On Metrology For Aerospace : May 29-30, 2014, Benevento, Italy : proceedings2014 / p. 155-160 : ill

artikkel kogumikus

artikkel ajakirjas

Metrology for industrial quantum communications : the MIQC projectRastello, Maria Luisa; Degiovanni, I. P.; Kübarsepp, ToomasMetrologia2014 / p. S267-S275 : ill

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artikkel kogumikus

The impact of metrology in industrial sector in EstoniaSimson, Kaarel; Kübarsepp, ToomasProceedings of the 8th International Conference of DAAAM Baltic Industrial Engineering, 19-21st April 2012, Tallinn, Estonia. 12012 / p. 227-232 : ill

artikkel kogumikus

Uncertainty evaluation of angle measurements by using 3D coordinate measurring machineDhoska, Klodian; Kübarsepp, Toomas; Hermaste, AigarProceedings of the 9th International Conference of DAAAM Baltic Industrial Engineering, 24-26th April 2014, Tallinn, Estonia2014 / p. 221-225 : ill

artikkel kogumikus

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metrology (võtmesõna)

teaviku laadid

võtmesõna 2