Registri loend: allikas - TalTech teadusportaal

Registri loend: allikas

IEEE International Conference on Semiconductor Electronics CD-ROM Proceedings (1)
IEEE International High Level Design Validation and Test Workshop (HLDVT'11), November 9-11, 2011, Napa Valley, CA (1)
IEEE International High Level Design Validation and Test Workshop, Oakland, California, USA, November 15-16, 1996 : proceedings (1)
IEEE International SOC Conference (1)
IEEE International Symposium on Circuits and Systems (ISCAS), Sapporo, Japan, 26-29 May 2019 : proceedings (1)
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1)
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings (1)
IEEE International Workshop on Machine Learning for Signal Processing (MLSP) : Aug. 29 - Sept.1, 2010, Kittilä, Finland (1)
IEEE International Workshop on Medical Measurement and Applications : MeMeA-2007 : Warsaw, Poland, 4-5 May 2007 (1)
IEEE International Workshop on Medical Measurement and Applications (MEMEA) (1)
IEEE International Workshop on Medical Measurements and Applications : MeMeA2009 : Cetraro, Italy, May 29-30, 2009 (1)
IEEE International Workshop on Metrology for the Sea ; Learning to Measure Sea Health Parameters (MetroSea) (1)
IEEE International Workshop on Open Source Test Technology Tools (IOST3) (1)
IEEE Internet of Things Journal (3)
IEEE ISQED 2000 : proceedings of the IEEE 2000 1st International Symposium on Quality Electronic Design : March 20-22, 2000, San Jose, California (1)
IEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California (1)
IEEE journal of design & test of computers (2)
IEEE journal of emerging and selected topics in industrial electronics (8)
IEEE journal of emerging and selected topics in power electronics (13)
IEEE Journal of indoor and seamless positioning and navigation (1)
IEEE journal of oceanic engineering (4)
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing (1)
IEEE microwave and guided wave letters (1)
IEEE Network (1)
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings (3)

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