Otsing - TalTech teadusportaal

kuva

reasta

226

artikkel kogumikus

Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba2005 / p. 232-237 : ill https://ieeexplore.ieee.org/document/1408779

artikkel kogumikus

227

artikkel kogumikus

Research environment for teaching digital testIvask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 468-473 : ill https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf

artikkel kogumikus

228

artikkel ajakirjas

Results of thermographic diagnostics of electric grid contact junctions and generators of oil shale power plantsDorovatovski, Nikolai; Liik, OlevOil shale2005 / 2S, p. 243-257 : ill https://artiklid.elnet.ee/record=b2346725*est

artikkel ajakirjas

229

artikkel kogumikus

Re-using chip level DFT at board levelGu, Xinli; Jutman, ArturProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p https://www.academia.edu/25351525/Re_using_chip_level_DFT_at_board_level

artikkel kogumikus

230

artikkel ajakirjas

Review of electrical machine diagnostic methods applicability in the perspective of Industry 4.0Asad, Bilal; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, Ants; Belahcen, AnouarScientific Journal of Riga Technical University. Electrical, control and communication engineering2018 / p. 108–116 : ill https://doi.org/10.2478/ecce-2018-0013

artikkel ajakirjas

231

artikkel ajakirjas

Review of high voltage instrument transformer condition monitoringAsefi, Sajjad; Asad, Bilal; Leinakse, Madis; Manninen, Henri; Kilter, Jako; Vaimann, Toomas; Kallaste, Ants; Tealane, Marko; Landsberg, MartIEEE Transactions on Dielectrics and Electrical Insulation2024 / 12 p https://doi.org/10.1109/TDEI.2024.3422260

artikkel ajakirjas

232

artikkel kogumikus

SAPDEC: a program devoted to automatic fault diagnosis of electric circuitsLiberatore, A.; Manetti, S.; Piccirilli, Maria Cristina; Reatti, A.Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section A. Section M / Tallinn Technical University1992 / p. 16-22: ill

artikkel kogumikus

233

artikkel kogumikus

Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

artikkel kogumikus

234

dissertatsioon

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

dissertatsioon

235

artikkel ajakirjas

Self-healing photovoltaic microconverter with zero redundancy and accurate low-cost fault detectionBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, DmitriIEEE transactions on industrial electronics2024 / p. 646-656 https://doi.org/10.1109/TIE.2023.3250836

artikkel ajakirjas

Seotud publikatsioonid 1

Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

236

artikkel ajakirjas

Sensorless detection of induction motor faults using the clarke vector approachVaimann, Toomas; Kallaste, Ants; Kilk, AleksanderScientific journal of Riga Technical University. Serija 4, Power and electrical engineering2011 / p. 43-48 : ill https://www.researchgate.net/publication/258547195_Sensorless_Detection_of_Induction_Motor_Rotor_Faults_Using_the_Clarke_Vector_Approach

artikkel ajakirjas

237

artikkel kogumikus

A set of tools for estimating quality of built-in self-test in digital circuitsJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the International Symposium on Signals, Circuits and Systems, Iasi (Romania), October 2-3, 19971997 / p. 362-365

artikkel kogumikus

238

artikkel kogumikus

7-valued algebra for transition delay fault analysisKõusaar, Jaak; Ubar, Raimund-JohannesBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 89-92 : ill

artikkel kogumikus

239

artikkel kogumikus

Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway2015 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2015.7364406

artikkel kogumikus

240

artikkel kogumikus

Shift register based TPG for at-speed interconnect BISTJutman, ArturMIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 22004 / p. 751-754 : ill https://ieeexplore.ieee.org/document/1314941?signout=success

artikkel kogumikus

241

artikkel kogumikus

Simple event correlator - best practices for creating scalable configurationsVaarandi, Risto; Blumbergs, Bernhards; Caliskan, Emin2015 IEEE International Multi-Disciplinary Conference on Cognitive Methods in Situation Awareness and Decision (CogSIMA 2015) : 9-12 March 2015, Orlando, Florida, USA2015 / p. 96-100 http://dx.doi.org/10.1109/COGSIMA.2015.7108181

artikkel kogumikus

242

artikkel kogumikus

Simulating system for minicomputer diagnostic programsKitsnik, Peeter; Ubar, Raimund-Johannes; Viilup, AguPreprints 1st IFAC/IFIP Symposium on Software for Computer Control, SOCOCO-76 : Tallinn, USSR, May 25-28, 19761976 / lk. [?] https://www.ester.ee/record=b1291026*est http://www.digar.ee/id/nlib-digar:451346

artikkel kogumikus

243

artikkel ajakirjas

Single gate design error diagnosis in combinational circuitsUbar, Raimund-Johannes; Borrione, DominiqueProceedings of the Estonian Academy of Sciences. Engineering1999 / 1, p. 3-21: ill https://artiklid.elnet.ee/record=b1000315*est

artikkel ajakirjas

244

artikkel ajakirjas

Sisseehitatud isetestimine digitaalsüsteemidesKruus, HelenaA & A2011 / lk. 32-37 : ill https://artiklid.elnet.ee/record=b2472216*est

artikkel ajakirjas

245

dissertatsioon

Software-based self-test for microprocessors with high-level decision diagrams = Mikroprotsessorite tarkvara-põhine enesetestimine kõrgtasandi otsustusdiagrammide põhjalJasnetski, Artjom2018 https://digi.lib.ttu.ee/i/?10629 https://www.ester.ee/record=b5151486*est

dissertatsioon

246

artikkel ajakirjas EST / artikkel ajakirjas ENG

State-of-the-Art techniques for fault diagnosis in electrical machines: Advancements and future directionsAkbar, Siddique; Vaimann, Toomas; Asad, Bilal; Kallaste, Ants; Sardar, Muhammad Usman; Kudelina, KarolinaEnergies2023 / Art. 6345 https://doi.org/10.3390/en16176345 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

247

dissertatsioon

Strained condition diagnosis and fatigue life prediction for metals under cyclic temperature oscillationsKlevtsov, Ivan1994 http://www.ester.ee/record=b1066290*est

dissertatsioon

248

raamat

Structural decision diagrams in digital test : theory and applicationsUbar, Raimund-Johannes; Raik, Jaan; Jenihhin, Maksim; Jutman, Artur2024 https://doi.org/10.1007/978-3-031-44734-1 https://www.ester.ee/record=b5734441*est

raamat

249

artikkel kogumikus

Structural fault collapsing by superposition of BDDs for test generation in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA2010 / p. 250-257 : ill https://ieeexplore.ieee.org/document/5450451

artikkel kogumikus

250

artikkel kogumikus

Structural test generation with employment of multiple observation time strategySkobtsov, VadimBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 299-302: ill

artikkel kogumikus

diagnostika (tehnika) (märksõna)

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märksõna 39

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