s.i. (kirjastus/väljaandja)

teaviku laadid

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  • artikkel kogumikus
    Description of digital objects with alternative graphs for test generation purposesUbar, Raimund-Johannes; Lohuaru, TõnuFault Tolerant Systems and Diagnostics : XI. International Conference ; Proceedings ; Suhl, June 6-9, 19881988 / p. [?]
    artikkel kogumikus
  • artikkel kogumikus
    Functional level test set generation methodsUbar, Raimund-JohannesProceedings of the 12th Conference on Fault-Tolerant Systems and Diagnostics, Prague, Czechoslovakia, September, 19891989 / p. 46-55
    artikkel kogumikus
  • artikkel kogumikus
    Multivalued simulation on AG-model of digital devicesUbar, Raimund-Johannes; Voolaine, AndrusProceedings of the 12th Conference on Fault-Tolerant Systems and Diagnostics, Prague, Czechoslovakia, September, 19891989 / p. 101-104
    artikkel kogumikus
  • artikkel kogumikus
    Test generation for microprocessor control mechanismsLohuaru, Tõnu; Ubar, Raimund-JohannesFTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)1987 / p. 305-311
    artikkel kogumikus
Kirjeid leitud 4, kuvan 1 - 4