Test generation for microprocessor control mechanisms
vastutusandmed
Lohuaru, T., Ubar, R.
allikas
FTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)
ilmumiskoht
Varna
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 305-311
konverentsi nimetus, aeg
10th International Conference on Fault-Tolerant Systems and Diagnostics, 1987
konverentsi toimumispaik
Varna
TTÜ struktuuriüksus
keel
inglise
Lohuaru, T., Ubar, R. Test generation for microprocessor control mechanisms // FTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987). Varna : s.i., 1987. p. 305-311.