Patri, S. K., Dick, I., Kaeval, K., Müller, J., Pedreno-Manresa, J-J., Autenrieth, A., Elbers, J-P., Tikas, M., Mas-Machuca, C.

prindi

Machine learning enabled fault-detection algorithms for optical spectrum-as-a-service users

autor

Patri, Sai Kireet

Dick, Isabella

Kaeval, Kaida

Müller, Jasper

Pedreno-Manresa, Jose-Juan

Autenrieth, Achim

Elbers, Jörg-Peter

Tikas, Marko

Mas-Machuca, Carmen

vastutusandmed

Sai Kireet Patri, Isabella Dick, Kaida Kaeval, Jasper Müller, Jose-Juan Pedreno-Manresa, Achim Autenrieth, Jörg-Peter Elbers, Marko Tikas, Carmen Mas-Machuca

allikas

2023 International Conference on Optical Network Design and Modeling (ONDM) : proceedings

kirjastus/väljaandja

IEEE

ilmumisaasta

2023

leheküljed

6 p. : ill

konverentsi nimetus, aeg

International Conference on Optical Network Design and Modeling (ONDM), May 8-11, 2023

konverentsi toimumispaik

Coimbra, Portugal

leitav

https://ieeexplore.ieee.org/document/10144858

märksõna

tehisõpe

vead

optiline andmeside

Scopus

võtmesõna

optical spectrum-as-a-service

optical networks

network monitoring

fault detection

machine learning (ML)

ISBN

978-3-903176-54-6

märkused

Bibliogr.: 14 ref

teaduspublikatsioon

klassifikaator

1.3

TTÜ struktuuriüksus

arvutisüsteemide instituut

keel

inglise

Patri, S. K., Dick, I., Kaeval, K., Müller, J., Pedreno-Manresa, J-J., Autenrieth, A., Elbers, J-P., Tikas, M., Mas-Machuca, C. Machine learning enabled fault-detection algorithms for optical spectrum-as-a-service users // 2023 International Conference on Optical Network Design and Modeling (ONDM) : proceedings. : IEEE, 2023. 6 p. : ill. https://ieeexplore.ieee.org/document/10144858