Otsing - TalTech teadusportaal

kuva

reasta

1

artikkel ajalehes

Akende vale paigaldus võib rikkuda uutesse akendesse tehtud investeeringuMartin, Anni; Talvik, Martindelfi.ee2025 Akende vale paigaldus võib rikkuda uutesse akendesse tehtud investeeringu https://kliimaministeerium.ee/buildest/tehnilised-lahendused

artikkel ajalehes

2

artikkel kogumikus

Artificial intelligence in monitoring and diagnostics of electrical energy conversion systemsVaimann, Toomas; Rassõlkin, Anton; Kallaste, Ants; Pomarnacki, Raimondas; Belahcen, Anouar; Van Khang, Hyunh2020 27th International Workshop on Electric Drives: MPEI Department of Electric Drives 90th Anniversary (IWED), Moscow, Russia, January 27-30, 20202020 / 4 p https://doi.org/10.1109/IWED48848.2020.9069566

artikkel kogumikus

3

artikkel ajakirjas EST / artikkel ajakirjas ENG

Assessment of along-normal uncertainties for application to terrestrial laser scanning surveys of engineering structuresMill, Tarvo; Ellmann, ArtuSurvey review2019 / p. 1-16 : ill https://doi.org/10.1080/00396265.2017.1361565 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

4

artikkel ajakirjas EST / artikkel ajakirjas ENG

Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill https://doi.org/10.1016/j.micpro.2012.11.004 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

5

artikkel ajakirjas EST / artikkel ajakirjas ENG

Automated design error localization in RTL designsJenihhin, Maksim; Tšepurov, Anton; Tihhomirov, Valentin; Raik, Jaan; Hantson, Hanno; Ubar, Raimund-Johannes; Bartsch, Günter; Meza Escobar, Jorge Hernan; Wuttke, Heinz-DietrichIEEE design & test of computers2014 / p. 83-92 : ill https://doi.org/10.1109/MDAT.2013.2271420 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

6

artikkel kogumikus

Automatic diagnosis of simple design errorsUbar, Raimund-Johannes; Borrione, DominiqueTIMA annual report 19981999 / p. 97-98

artikkel kogumikus

7

artikkel kogumikus

Automatic diagnosis of simple design errorsUbar, Raimund-Johannes; Borrione, DominiqueTechniques of Informatics and Microelectronics for Computer Architecture1999 / p. 91

artikkel kogumikus

8

artikkel ajakirjas EST / artikkel ajakirjas ENG

Bearing fault analysis of BLDC motor for electric scooter applicationKudelina, Karolina; Asad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Rassõlkin, Anton; Kallaste, Ants; Lukichev, DmitryDesigns2020 / art. 42, 18 p. : ill https://doi.org/10.3390/designs4040042 Journal metrics at Scopus Article at Scopus

artikkel ajakirjas EST / artikkel ajakirjas ENG

9

artikkel ajakirjas

Biasing error correction in averaging current-mode rectifiersMännama, Vello; Wilson, BrettProceedings of the Estonian Academy of Sciences. Engineering2000 / 2, p. 135-143 : ill

artikkel ajakirjas

10

artikkel kogumikus

Block-level fault model-free debug and diagnosis in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 12th EUROMICRO Conference on Digital System Design, Architectures, Methods and Tools : Patras, Greece, August 27-29, 20092009 / p. 229-232 https://ieeexplore.ieee.org/document/5350128

artikkel kogumikus

11

artikkel kogumikus

Boolean fault dignosis with structurally synthesized BDDsUbar, Raimund-JohannesRecent progress in the Boolean domain2014 / p. 303-331 : ill

artikkel kogumikus

12

artikkel kogumikus

Challenges of reliability assessment and enhancement in autonomous systemsJenihhin, Maksim; Sonza Reorda, Matteo; Balakrishnan, Aneesh; Alexandrescu, Dan2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)2019 / 6 p https://doi.org/10.1109/DFT.2019.8875379

artikkel kogumikus

Seotud publikatsioonid 1

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

13

artikkel kogumikus

Combining dynamic slicing and mutation operators for ESL correctionRepinski, Urmas; Hantson, Hanno; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France2012 / [6] p. : ill https://ieeexplore.ieee.org/document/6233020

artikkel kogumikus

14

artikkel kogumikus

Comparative analysis of reliability for string and central inverter PV systems in accordance with the FMECADumnic, Boris; Liivik, Elizaveta; Popadic, Bane; Blaabjerg, Frede; Milicevic, Dragan; Katic, Vladimir2020 IEEE 11th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), 28 Sept.-1 Oct. 2020, Dubrovnik, Croatia2020 / p. 591-596 https://doi.org/10.1109/PEDG48541.2020.9244404

artikkel kogumikus

15

artikkel kogumikus

Comprehensive computations of the response of faulty cage induction machinesBelahcen, Anouar; Martinez, Javier; Vaimann, ToomasProceedings of the 2014 International Conference on Electrical Machines (ICEM)2014 / p. 1504-1509 : ill

artikkel kogumikus

16

artikkel kogumikus

Defects, faults and fault modelsGramatova, Elena; Fisherova, Maria; Ubar, Raimund-Johannes; Pleskacz, Witold A.Handbook of testing electronic systems2005 / p. 26-96 : ill

artikkel kogumikus

17

artikkel ajakirjas

DefSim: a remote laboratory for studying physical defects in CMOS digital circuitsPleskacz, Witold A.; Stopjakova, Viera; Borejko, Tomasz; Jutman, Artur; Walkanis, AndrzejIEEE transactions on industrial electronics2008 / 6, p. 2405-2415 : ill https://www.researchgate.net/publication/3219964_DefSim_A_Remote_Laboratory_for_Studying_Physical_Defects_in_CMOS_Digital_Circuits

artikkel ajakirjas

18

artikkel kogumikus

DefSim: CMOS defects on chip for research and educationPleskacz, Witold A.; Borejko, Tomasz; Walkanis, A.; Stopjakova, Viera; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 74-79 : ill

artikkel kogumikus

19

artikkel kogumikus

DefSim: measurement environment for CMOS defectsBorejko, Tomasz; Jutman, Artur; Pleskacz, Witold A.; Ubar, Raimund-Johannes2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 22006 / p. 679-682 https://ieeexplore.ieee.org/document/1651048

artikkel kogumikus

20

artikkel kogumikus

Design error localization in digital circuits by stuck-at fault test patternsJutman, Artur; Ubar, Raimund-Johannes[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 22000 / p. 723-726 https://ieeexplore.ieee.org/document/838792

artikkel kogumikus

21

artikkel ajakirjas

Determining asphalt binder aging by using limiting phase angle temperatureLill, Kristjan; Kontson, Karli; Aavik, AndrusBaltic journal of road and bridge engineering2024 / p. 28-49 https://doi.org/10.7250/bjrbe.2024-19.647

artikkel ajakirjas

22

artikkel kogumikus

Diagnostic modeling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, MaksimDesign and test technology for dependable systems-on-chip2011 / p. 92-118 : ill https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams

artikkel kogumikus

23

artikkel kogumikus

Digital measurement of periodic signals root-mean-square valueCitavicius, A.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 317-320: ill

artikkel kogumikus

24

artikkel kogumikus

Digital twin of wind generator for modelling various turbine characteristicsRaja, Hadi Ashraf; Autsou, Siarhei; Kudelina, Karolina; Rjabtšikov, Viktor; Vaimann, Toomas; Kallaste, Ants; Pomarnacki, Raimondas; Hyunh, Van Khang2023 International Conference on Electrical Drives and Power Electronics (EDPE)2023 / p. 1-5 https://doi.org/10.1109/EDPE58625.2023.10274050

artikkel kogumikus

25

artikkel ajakirjas

Early RTL analysis for SCA vulnerability in fuzzy extractors of memory-based PUF enabled devicesLai, Xinhui; Jenihhin, Maksim; Selims, GeorgiosarXiv.org2020 / 6 p. : ill https://doi.org/10.48550/arXiv.2008.08409 https://arxiv.org/abs/2008.08409

artikkel ajakirjas

Seotud publikatsioonid 1

Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid

vead (märksõna)

teaviku laadid

märksõna 1