prindi

FP7 collaborative research project DIAMOND : diagnosis, error modeling and correction for reliable systems design

autor
Raik, Jaan
vastutusandmed
Jaan Raik
allikas
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
ilmumiskoht
Los Alimitos
kirjastus/väljaandja
IEEE Computer Society
ilmumisaasta
2012
leheküljed
1 p
konverentsi nimetus, aeg
2012 17th IEEE European Test Symposium (ETS), May 28th–June 1st, 2012
konverentsi toimumispaik
Annecy, France
leitav
https://ieeexplore.ieee.org/document/6233052
märksõna
nanoelektroonika
süsteemianalüüs
vigade teooria
ISBN
978-1-4673-0697-3
keel
inglise
Raik, J. FP7 collaborative research project DIAMOND : diagnosis, error modeling and correction for reliable systems design // Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France. Los Alimitos : IEEE Computer Society, 2012. 1 p. https://ieeexplore.ieee.org/document/6233052