High temperature investigation of ZnS:Ga and CdSe:Ga
vastutusandmed
K.Lott, T.Nirk, O.Volobujeva, S.Shinkarenko, A.Grebennik and A.Vishnjakov
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The 23rd International Conference on Defects in Semiconductors : ICDS-23 : Awaji island, Japan, July 24 - July 29, 2005 : program and abstracts
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[S. l.]
ilmumisaasta
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p. 210 : ill
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Bibliogr.: 2 ref
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inglise
Lott, K., Nirk, T., Volobujeva, O., Šinkarenko, S., Grebennik, A., Vishnjakov, A. High temperature investigation of ZnS:Ga and CdSe:Ga // The 23rd International Conference on Defects in Semiconductors : ICDS-23 : Awaji island, Japan, July 24 - July 29, 2005 : program and abstracts. [S. l.], 2005. p. 210 : ill.