Comparison of model-based error localization algorithms for C designs
                                            autor
                                    
                                    
                                
                                            vastutusandmed
                                    
                                    
Repinski, Urmas, Raik, Jaan
                                                    
                                            
                                            ilmumiskoht
                                    
                                    
[S.l.]
                                                    
                                            
                                            kirjastus/väljaandja
                                    
                                    
                                
                                            ilmumisaasta
                                    
                                    
                                
                                            leheküljed
                                    
                                    
p. 42-45
                                                    
                                            
                                            konverentsi nimetus, aeg
                                    
                                    
10th IEEE East-West Design & Test Symposium (EWDTS), September 14-17, 2012
                                                    
                                            
                                            konverentsi toimumispaik
                                    
                                    
Kharkov, Ukraine
                                                    
                                            
                                            keel
                                    
                                    
inglise
                                                    
                                            
                            Repinski, U., Raik, J. Comparison of model-based error localization algorithms for C designs // Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 2012. [S.l.] : IEEE Computer Society, 2012. p. 42-45.