IJTAG-compatible symptom-based SEU monitors for FPGA DNN accelerators
statement of authorship
Natalia Cherezova, Maksim Jenihhin, Artur Jutman
source
2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
location of publication
Piscataway, New Jersey
publisher
year of publication
pages
6 p. : ill
conference name, date
IEEE 2nd International Conference on Design, Test and Technology of Integrated Systems (DTTIS), 14-16 Oct. 2024
conference location
Aix-En-Provence, France
ISBN
979-8-3503-6312-8
notes
Bibliogr.: 28 ref
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
subject term
Cherezova, N., Jenihhin, M., Jutman, A. IJTAG-compatible symptom-based SEU monitors for FPGA DNN accelerators // 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS). Piscataway, New Jersey : IEEE, 2024. 6 p. : ill.