High-level test data generation for software based self-test in microprocessors
author
Oyeniran, Adeboye Stephen
Jasnetski, Artjom
Tšertov, Anton
Ubar, Raimund-Johannes
statement of authorship
Adeboye Stephen Oyeniran, Artjom Jasnetski, Anton Tsertov, Raimund Ubar
source
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
location of publication
Piscataway
publisher
IEEE
year of publication
2017
pages
p. 86-91 : ill
conference name, date
6th Mediterranean Conference on Embedded Computing (MECO), 11-15 June 2017
conference location
BAR, Montenegro
url
https://doi.org/10.1109/MECO.2017.7977167
subject term
mikroprotsessorid
testimine
keyword
microprocessors
fault models
test generation
fault simulation
software-based self-test
ISSN
2377-5475
ISBN
978-1-5090-6741-1
notes
Bibliogr.: 23 ref
TTÜ department
arvutisüsteemide instituut
language
inglise